P-on-N type long-wave HgCdTe infrared detector has a lower dark current than n-on-p type, and the smaller dark current enables the detector to have higher detection ability in the detection of low radiation flux. In view of the fact that the detectivity of the device response test cannot be effectively improved due to the short integration time in the context of the blackbody at room temperature, the relationship between the detectivity D* of the device in the low temperature background and the working temperature of the device as well as the temperature of the blackbody radiation source is tested and analyzed with placing the low-temperature blackbody radiation source in the Dewar cavity. The test results of the detectivity D* of the p-on-n type infrared detector at low luminous flux can provide guidance for the application of the device.