Abstract:In aerospace applications, it is found that the output of HgCdTe infrared detector preamplifier circuit is normal at room temperature, but there is an oscillation phenomenon when the temperature is reduced to -55℃, and the oscillation phenomenon is aggravated by applying infrared irradiation to the detector. In this paper, this phenomenon is systematically investigated for the first time, and an equivalent circuit model of the HgCdTe infrared detector circuit after low-temperature irradiation is presented. The mechanism of the oscillation of the preamplifier circuit at low temperature is analysed from the perspective of phase margin and gain margin. Based on this analysis, a solution is proposed to inhibit the oscillation of the preamplifier circuit after illumination at low temperatures. The validity of the method was confirmed by the experimental results.