(1. 上海理工大学 理学院, 上海 200093;2. 中国科学院上海技术物理研究所 中国科学院红外成像材料与器件重点实验室, 上海 200083)
TN304
国家重点研发计划项目(2021YFA0715501).通信作者:许金通 E-mail:xujintong@mail.sitp.ac.cn
(1. College of Science, University of Shanghai for Science and Technology, Shanghai 200093, CHN;2. Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, CHN)
黄宏,桑茂盛,王妮丽,徐国庆,许金通.瞬态光响应法测试中波碲镉汞器件少子寿命的新方法[J].半导体光电,2023,44(4):596-599. HUANG Hong, SANG Maosheng, WANG Nili, XU Guoqing, XU Jintong. A New Method for Measuring The Minority Carrier Lifetime of MWIR HgCdTe Materials by Transient Photoresponse Method[J].,2023,44(4):596-599.
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