(重庆光电技术研究所, 重庆 400060)
TN306
(Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN)
鲍江,刘必晨,张佳宁,赵瑞莲,李冰.非破坏性键合拉力拉钩位置偏离对键合可靠性影响分析[J].半导体光电,2023,44(3):404-407. BAO Jiang, LIU Bichen, ZHANG Jianing, ZHAO Ruilian, LI Bing. The Influence of Hook Position Deviation of Nondestructive Bond Pulling on Bonding Reliability[J].,2023,44(3):404-407.
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