(重庆光电技术研究所, 重庆 400060)
TN386.5
(Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN)
唐遵烈,李博乐,周建勇,涂戈,江宇祺,李晓力. CCD电荷转换因子通用测试方法研究[J].半导体光电,2023,44(2):199-203. TANG Zunlie, LI Bole, ZHOU Jianyong, TU Ge, JIANG Yuqi, LI Xiaoli. Study of A General Testing Scheme of the CCD’s Charge to Voltage Factor[J].,2023,44(2):199-203.
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