Abstract:In this paper, Al-doped ZnO (AZO) films with better photoelectric properties were prepared by the dual-target co-sputtering method. Various technical methods such as X-ray diffractometer, Hall tester and SEM were used to study the influence of different Al sputtering power and rapid annealing conditions on the performance of AZO film. It is found that the AZO films present the best performance when the Al sputtering power is 15W and the annealing temperature is 400℃. When the Al sputtering power is 15W, its lowest resistivity is 6.552×10-4Ω·cm, and the average transmittance in the visible light band (400~700nm) exceeds 92%. With the increase of Al sputtering power, the transmittance in the visible light band gradually decreases, while the transmittance in the infrared band (2.5~20μm) gradually increases, and the maximum value reaches 40%.