Abstract:The near-zero dielectric constant mode provides a new way to control the interaction of light and matter at the nanoscale. In this paper, the principle of attenuated total reflection was used to excite the ENZ modes of phonon polariton and gallium nitride films of aluminum oxide substrates respectively. By adjusting the film thickness and optimizing the gap between air layers, the coupling hybrid of the double-layer structure mode was achieved. The transmission matrix method and finite time domain difference method were used to numerically calculate the electric field distribution and dispersion of the mixed mode, indicating that the coupling splitting occurs in the two modes due to the strong coupling conditions. In the spectrum simulated by FDTD, both the high-frequency and low-frequency branches of the dispersion relationship show strong coupling at the anti-crosspoints, and the ENZ-SPhP mixed mode can be observed from the electric field diagram. ENZ-SPhP hybrid mode has high propagation characteristics and sub-wavelength light limitation, which can be used as the basis for future infrared and terahertz nanophotonic integration and communication equipment.
