基于低频电噪声的光电耦合器可靠性筛选方法研究

Reliability Screening Method for Optoelectronic Coupled Devices Based on Low-Frequency Electronic Noise

摘要:

低频电噪声是表征电子器件质量和可靠性的敏感参数,通过测试低频噪声,可以快速、无损地实现光耦器件的可靠性评估。通过开展可靠性老化对光电耦合器低频噪声特性影响的试验研究,提出基于低频段宽频带噪声参数的光电耦合器可靠性筛选方法,并将可靠性筛选结果与点频噪声筛选方法结果进行对比分析。结果表明,与点频噪声参数等现有方法相比,宽频带噪声参数可以更灵敏和准确地表征器件可靠性,同时计算简便,基于宽频带噪声参数的光电耦合器可靠性筛选方法可以实现更为准确合理的可靠性分类筛选。

Abstract:

Low-frequency noise (LFN) is the key parameter for characterizing the quality and reliability of electronic devices, so it can realize the reliability evaluation of optoelectronic coupled devices (OCDs) quickly and nondestructively by testing LFN. In this paper, based on studying the influence of reliability aging tests on the LFN characteristics of OCDs, the reliability screening method based on wideband noise in low frequency range is proposed to analyze the noise data of OCDs. And its reliability screening results are compared with that of the single frequency 1/f noise method. Experimental results demonstrate that, compared with single frequency noise, the wideband noise is more sensitive and accurate in indicating the reliability of OCDs, and also it is more convenient in computation. The wideband noise method improves the accuracy and rationality of reliability screening of OCDs.