In order to reduce the strong piezoelectric field in InGaN/GaN multiple quantum wells (MQWs), the influence of the prestrained InGaN interlayer on crystal quality and the emission properties of blue-violet InGaN/GaN MQWs in LD structures was investigated by means of the electroluminescence (EL) and high resolution X-ray diffraction (HRXRD). It is observed that the integrated EL intensity is increased by inserting a prestrained InGaN interlayer at room temperature. Furthermore, theoretical simulation shows that the piezoelectric field is reduced by inserting the InGaN interlayer. Therefore, the prestrained InGaN interlayer is beneficial to release the strain of MQW layer and weaken the quantum-confined Stark effect (QCSE), leading to the improvement of the light emission efficiency of blue-violet InGaN/GaN MQW LDs.