激光干扰行间转移CCD串扰现象研究

Study on Cross-talk of Laser Jamming on Interline Transfer CCD

摘要:

分析了激光功率密度增加到原来的10倍的时候, 激光干扰行间转移CCD的串扰图像部分的灰度值并不是成比例地增加, 并对串扰图像进行了仿真。由于光电二极管的溢出是不断进行的, 垂直CCD的每个像元都获得所有超过阈值的像元溢出的光生载流子之和。每个超过阈值的像元溢出的光生载流子等于垂直CCD向下移动一个像元所需的时间内溢出的光生载流子。通过求解感光部分中光生电子遵守的方程, 得到电子浓度增量和入射光功率的关系, 进而仿真出串扰图像。仿真了激光能量为串扰阈值10倍和100倍量级时的串扰图像, 仿真结果和实验结果可比。

Abstract:

Experimental results indicate that the gray scales of the cross-talk image of laser jamming on interline transfer CCD do not change in proportion to the laser power. This phenomenon was analyzed and the cross-talk image was simulated. Because the overflowing of the photo-electric diode is continuous, every pixel of vertical CCD can attain the sum of the overflowing of laser-induced carriers from the pixels above the threshold. The change of the laser-induced carriers is expressed by the change of the concentration of the carriers. The equation of the laser-induced electron in p-n junction is solved, and the increment of the concentration of the laser-induced electron via the laser power is obtained. Thus the cross-talk image is simulated. The cross-talk images with the laser power of 10 and 100 times of the cross-talk threshold are simulated, and the result is comparable with the experiment result.