Abstract:It is difficult to fabricate nice photonic crystal on high doped p Si by electrochemical etching process. In this paper, the effects of the etching time and etching current on effective optical thickness (EOT) of the porous silicon layer prepared on p type silicon substrate were investigated. The structure and EOT of porous silicon photonic crystal were studied by the spectrometer (U 4100) and field emission scanning electron microscopy (FE SEM). And it is revealed that if the etching time and etching current are reasonably selected, the EOT of porous silicon can be accurately prepared. And the method can be widely applied for the fabrication of porous silicon photonic crystal.