Abstract:To optimize the noise performance of infrared ROIC with different wavebands, a systematic noise model for CTIA structure based ROIC was presented. The relationship between the integration parameters and the noise was analyzed. The optimized analysis linked the physical characteristics and photocurren with the noise of the ROIC, and it was indicated that for different IR detectors, within some certain manufacturing process, there are optimal integration parameters, and the value is directly related to the shunt capacitor of the IR device. And also the interaction effects between the noise and the circuit structure are diverse: the improvement of CDS on long wave ROIC is much better than that on medium wave ROIC.