Abstract:A flat glass thickness measuring system based on light reflection is built. By CCD imaging lens, the double line images of the line laser reflected by the up-down surfaces of the flat glass will form on the CCD photosurface. Then the distributed curve and data of the image light intensity with the pixels are acquired by the data acquisition card. By the methods of wavelet denoising and doublet fitting, the pixel difference (ΔN) between the double line images is acquired, and then the flat glass thickness can be computed. Before measuring, the system is calibrated by using the normal flat glass to determinate the proportionality factor (k), and then, different thicknesses will be measured. The results compared with the milscale measuring value indicate the proposed method is feasible and effective with a relative error of 0.01.
