Abstract:Based on the silicon minority carrier lifetime measurement system applying microwave frequency shift (FS) method, combining sampling circuit with pulse counter to detect the reflect microwave attenuation signals can avoid the affect of background noise in detecting the decay curve by using the oscilloscope, and can make the detecting instrument more compact and portable. The reflect waveforms under different states are analyzed and the circuits for signal sampling and timing are designed for the reflect microwave. It is showed that the experimental results coincide with the observing decay curve obtained by oscilloscope, proving the feasibility of this new design.