Based on the study of image-based grain location technology,a method for orientating grains by drawing spaced grid lines.In this method,first the wafer images are segmented with thresholds,and the grain edge of the segmented images are extracted.And then three center coordinates of the grains that are adjacent but not in the same line can be calculated based on the principle of grain edge extraction and the determination of a circle by three non-collinear points.The offset and the slope of the drawing grid ...